Alma Mater Digital Library
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Browse the list: Convegni ed altri Eventi
Number of documents:1. Traverso, P.A. ; Pirazzini, M. ; Santarelli, A. ; Filicori, F. ; Raffo, A. (2005) Automated microwave device characterization set-up based on a technology-independent generalized Bias System. In: Proceedings of the 22nd IEEE Instrumentation and Measurement Technology Conference. IMTC 2005., 16-19 maggio 2005, Ottawa, Canada. |
