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Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents

Meng, C. C. ; Peng, A. S. ; Wen, S. Y. ; Huang, G. W. (2002) Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.

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Abstract

Average rf gate and drain currents can be used to determine gain compression mechanisms for PHEMTs with different pinch-off voltages. Knee voltage, pinch-off voltage, breakdown voltage and Imax clip output I-V waveform of a PHEMT and cause gain compression. We found that there is a distinct signature in average rf gate and drain currents to characterize each gain compression mechanism in PHEMTs. A PHEMT with low pinch-off voltage behaves the same in rf gate and drain currents as a PHEMT with high pinch-off voltage in pinch-off voltage, knee voltage and breakdown voltage gain compression mechanisms, but behaves differently in Imax gain compression mechanisms.

Document type:Conference or Workshop Item (Paper)
Subjects:Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
Depositato da:CIB Staff
Depositato il:17 Jun 2004
Last modified:16 May 2011 13:22

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