Maya, M.C. ; Lazaro, A. ; Pradell, L. (2002) Determination of FET noise parameters from 50 Ω noise figure measurements using a distributed noise model. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract
A method for measuring FET noise parameters is presented. It is based on the determination of a distributed noise model from 50 Ω noise figure measurements without needing a tuner, and taking into account the propagation effects along device electrodes. Experimental results up to 40 GHz are given.
| Document type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica |
| Depositato da: | CIB Staff |
| Depositato il: | 17 Jun 2004 |
| Last modified: | 16 May 2011 13:22 |
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