Fagan, Christopher J. ; Snowden, Christopher M. (2001) Electro-Thermal modelling of very High power Microwave bipolar Junction transistors. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract
This paper describes a new approach to accurately characterise very high power, Si BJT, devices capable of delivering powers in excess of 250W, at L band, in a class C amplifier configuration. Conventional modelling approaches are not suitable for large power structures. An alternative electro-thermal, equivalent circuit model, has been constructed using a novel hierarchical approach. The thermal dependence of the device characterisation is removed during the extraction of the electrical circuit and is reinserted, within the model, using a suitably complex thermal network, determined using a fully physical thermal simulator. Theoretical and experimental results are shown for steady state and pulsed amplifier operation.
| Document type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica |
| Depositato da: | CIB Staff |
| Depositato il: | 17 Jun 2004 |
| Last modified: | 16 May 2011 13:22 |
Solo per lo Staff dell Archivio: Gestione del documento

