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Electro-Thermal modelling of very High power Microwave bipolar Junction transistors

Fagan, Christopher J. ; Snowden, Christopher M. (2001) Electro-Thermal modelling of very High power Microwave bipolar Junction transistors. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.

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Abstract

This paper describes a new approach to accurately characterise very high power, Si BJT, devices capable of delivering powers in excess of 250W, at L band, in a class C amplifier configuration. Conventional modelling approaches are not suitable for large power structures. An alternative electro-thermal, equivalent circuit model, has been constructed using a novel hierarchical approach. The thermal dependence of the device characterisation is removed during the extraction of the electrical circuit and is reinserted, within the model, using a suitably complex thermal network, determined using a fully physical thermal simulator. Theoretical and experimental results are shown for steady state and pulsed amplifier operation.

Document type:Conference or Workshop Item (Paper)
Subjects:Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
Depositato da:CIB Staff
Depositato il:17 Jun 2004
Last modified:16 May 2011 13:22

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