Rodriguez-Tellez, J. ; Ali, N.T. ; Fernandez, T. ; Mediavilla, A. ; Tazon, A. (2001) Electric field dependency of traps in mesfet/hemt devices. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
Full text disponibile come:
![[img]](http://amsacta.cib.unibo.it/style/images/fileicons/application_pdf.png)
| PDF 55Kb |
Abstract
A new measurement procedure for observing the dependence of the frequency dispersion effect on electric field for GaAs MESFET/HEMT devices is presented. The new procedure employs a statistically based pulse I/V measurement system for observing the memory effect in these devices. The results indicate, possibly for the first time, the true extent of the effects of the traps in these devices.
| Document type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica |
| Depositato da: | CIB Staff |
| Depositato il: | 17 Jun 2004 |
| Last modified: | 16 May 2011 13:21 |
Solo per lo Staff dell Archivio: Gestione del documento
