Kamenopolsky, Stanimir ; Dankov, Plamen (2001) High performance test fixture for 10-Port MMIC's characterisation. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract
High-performance measuring multi-port 3-level fixture for active device characterization in the Ku-band is described in this paper. It is a low-cost alternative of the expensive microwave "on-wafer" measurements with CPW probes. The method of modeling of the separate components of the each embedding RF-path of the fixture is used for de-embedding purposes. Testing of several phantom-type structures on the chip-carrier level confirms the ability of the considered fixture to give repeatable results for the extracted own MMIC's parameters: mainly for the insertion phase and the gain.
| Document type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica |
| Depositato da: | CIB Staff |
| Depositato il: | 17 Jun 2004 |
| Last modified: | 16 May 2011 13:21 |
Solo per lo Staff dell Archivio: Gestione del documento
