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Near-field measurement of microwave active devices

Gasquet, D. ; Nativel, L. ; Arcambal, C. ; Castagné, M. ; Dhondt, F. ; Mazari, B. ; Eudeline, P. (2000) Near-field measurement of microwave active devices. In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.

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Abstract

A completely new near field mapping system based on micro monopole antenna has been developed in order to determine the electric near-field at the surface of MMIC. The possibilities of this innovative experimental setup are shown by 2D mapping of a bend 5 line deposited on GaAs substrate and a coupled-line filter on Duroid 6002. These are supported by 3D electromagnetic simulations. We finally give some results obtained on a real MMIC with a medium resolution of 50µm. The industrial applications are clearly the reliability issues of microwave power devices but also a new tool for MMIC designers. The knowledge of radiated near field will also contribute to optimize the packaging of microwave functions.

Document type:Conference or Workshop Item (Paper)
Subjects:Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
Depositato da:CIB Staff
Depositato il:17 Jun 2004
Last modified:16 May 2011 13:24

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