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A single relaxation-time non-quasi-static model for monolithic MESFET devices

Martín-Guerrero, T.M. ; Esteban-Marzo, J. ; Castillo-Vázquez, B. ; Camacho-Peñalosa, C. (2002) A single relaxation-time non-quasi-static model for monolithic MESFET devices. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.

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Abstract

In this contribution a MESFET equivalent circuit that takes into account the device’s non-quasi-static (NQS) effects is presented. The model topology is deduced directly from the small-signal measurement analysis and consists of a small-signal equivalent circuit that can be obtained from the linearization of a non-linear NQS model with non-linear state-functions (terminal charges and currents) that include a single relaxation-time. Results confirm that just one relaxation-time for all components is needed. The proposed model provides small-signal simulation performance similar to conventional models, but incorporating NQS effects in a consistent way and using just a reduced number of non-linear functions.

Document type:Conference or Workshop Item (Paper)
Subjects:Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
Depositato da:CIB Staff
Depositato il:17 Jun 2004
Last modified:16 May 2011 13:23

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