Centurelli, F. ; Luzzi, R. ; Scotti, G. ; Tommasino, P. ; Trifiletti, A. (2002) Design Centering and Yield Optimisation of MMIC’s with Off-Chip Digital Controllers. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract
In this paper, a new methodology to perform yield-oriented design of MMIC’s in III-V technologies is proposed. A digital control of MMIC bias, based on process parameters estimation by on-chip auxiliary circuits, allows yield enhancement. The design centering approach and a distance-dependent correlated statistical model of HEMT devices are used to design the external controller. The design of a MMIC for optical digital systems has highlighted significant yield improvement with respect to previously proposed methodologies
| Document type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica |
| Depositato da: | CIB Staff |
| Depositato il: | 17 Jun 2004 |
| Last modified: | 16 May 2011 13:22 |
Solo per lo Staff dell Archivio: Gestione del documento
